[1]杨程,胡艳,沈瑞琪,等.多层Al/Ti纳米含能桥膜的电爆性能研究[J].爆破器材,2015,44(01):33-36.[doi:10.3969/j.issn.10018352.2015.01.008]
　YANG Cheng,HU Yan,SHEN Ruiqi,et al.Study on Electro Explosion Performance of Al/Ni Nanoenergetic Multilayer Bridge Films[J].EXPLOSIVE MATERIALS,2015,44(01):33-36.[doi:10.3969/j.issn.10018352.2015.01.008]
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多层Al/Ti纳米含能桥膜的电爆性能研究()
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《爆破器材》[ISSN:1001-8352/CN:32-1163/TJ]

卷:
44
期数:
2015年01
页码:
33-36
栏目:
爆破技术
出版日期:
2015-02-20

文章信息/Info

Title:
Study on Electro Explosion Performance of Al/Ni Nanoenergetic Multilayer Bridge Films
文章编号:
4820
作者:
杨程; 胡艳; 沈瑞琪; 叶迎华
南京理工大学化工学院（江苏南京，210094）
Author(s):
YANG Cheng;  HU Yan; SHEN Ruiqi;  YE Yinghua
School of Chemical Engineering, Nanjing University of Science and Technology (Jiangsu Nanjing, 210094)
关键词:
纳米含能桥膜; Al/Ti; 调制周期; 电爆性能
Keywords:
nano-energetic bridge films;  Al/Ti;  modulation period;  electric explosion performance
分类号:
TJ45; TQ560.7
DOI:
10.3969/j.issn.10018352.2015.01.008
文献标志码:
A
摘要:
利用磁控溅射法制备了不同调制周期的多层Al/Ti纳米含能桥膜，并在电容放电激励下对其电爆性能进行测试，Al/Ti纳米含能桥膜的爆发时间随着电压的增大而降低，而等离子体持续时间随着电压的增加而增大。高速摄影仪记录的Al/Ti纳米含能桥膜的电爆过程表明，在相同的激励电压下，Al/Ti纳米含能桥膜的电爆现象明显比Al桥膜和Ti桥膜剧烈，且伴随着高温粒子四处飞溅，飞溅高度约有4~6 mm，同时Al/Ti纳米含能桥膜的电爆持续时间均长于Al桥膜和Ti桥膜的电爆持续时间，这与伏安特性曲线得出的结论一致。
Abstract:
Multilayered Al/Ti nano-energetic bridge films were prepared by RF magnetron sputtering with different modulation period. Electric explosion performances were investigated when Al/Ti nanoenergetic bridge films were ignited using a capacitordischarger power supply. The outbreak time of Al/Ti nano-energetic bridge film increased with voltage decrease and plasma duration time increased with the increase of voltage. The electric explosion processes of Al bridge film, Ti bridge film and Al/Ti nanoenergetic bridge films were recorded by highspeed photography respectively. The results show that Al/Ti nanoenergetic bridge films have more drastic electric explosion, the high temperature splash particles of Al/Ti nano-energetic bridge films are about 46 mm high. And the duration of electric explosion time of Al/Ti nano-energetic bridge films is higher than Al and Ti bridge films, which are consistent with the voltampere characteristic curves. 

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备注/Memo

备注/Memo:
收稿日期：2014-05-25
基金项目：江苏省自然科学基金青年基金项目(BK20140788);总装预研基金（9140A05070114BQ02073）
作者简介：杨程（1987~），男，博士研究生，从事Al/Ni和Al/Ti等合金化桥膜的研究。E-mail:yangchengyashua@126.com
通信作者：沈瑞琪（1963~），男，博导，教授，主要从事含能材料点火与起爆技术、火工技术、激光辐射效应研究。E-mail:rqshen@mail.njust.edu.cn
更新日期/Last Update: 2015-03-01